Patent
1985-07-11
1987-08-25
James, Andrew J.
357 40, 357 41, 357 65, H01L 2348, H01L 2944, H01L 2952, H01L 2960
Patent
active
046896570
ABSTRACT:
During the manufacture of semi-custom monolithic integrated circuits or semiconductor devices silicon wafers with P-type or N-type impurity regions are used and interconnections must be produced for specific applications. Unlike currently known technologies, an electrically conductive film containing standardized openings in a pre-arranged raster is deposited on the silicon wafer. Subsequently, the conductive film is removed between preselected openings directly or indirectly by means of electromagnetic radiation in order to produce the required circuit configuration. A laser beam is particularly appropriate therefor because such beam can be positioned and controlled and can be used directly for the exposure of a photosensitive film. The production of isolated conductive areas in the conductive film is then accomplished by photo-etching. The use of an expensive customer specific photomask can thus be avoided. In the thus obtained semiconductor device the conductive film contains a regular arrangement of openings which form the ends, sides or corners of isolated conductive areas.
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"SPIE's 1987 Santa Clara Symposium on Microlithography, Advance Program", Mar. 1-6, 1987, The Int'l Soc. For Optical Engineering, pp. 1-15.
Fitzgibbons et al., "A Direct Write Laser Pattern Generator for Rapid Semiconductor Device Customization", SPIE's Santa Clara Symposium on Microlithography, Mar. 1-6, 1987.
Percival Richard
Uhlmann Ernst
James Andrew J.
Kleeman Werner W.
Lasarray Holding AG
Mintel William A.
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