Method of manufacturing semiconductor device isolation

Fishing – trapping – and vermin destroying

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437 70, 437 72, H01L 2176, H01L 21302

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048973637

ABSTRACT:
In a method of manufacturing a semiconductor device according to the present invention, regions of first conductivity type buried layers formed on a first conductivity type substrate are retracted with respect to regions of second conductivity type buried layers. Thus, in formation of second conductivity type epitaxial layer, first conductivity type impurity contained in the first conductivity type buried layers is prevented from floating diffusion up to element regions of the second conductivity type epitaxial layers. At the same time, the semiconductor device can be implemented with high density of integration.

REFERENCES:
patent: 4381956 (1983-05-01), Lane
patent: 4434543 (1984-03-01), Schwabe et al.
patent: 4694562 (1987-09-01), Iwasaki et al.

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