Measuring and testing – Vibration – By mechanical waves
Patent
1986-09-08
1988-03-15
Chapman, John
Measuring and testing
Vibration
By mechanical waves
G01N 2904
Patent
active
047304944
ABSTRACT:
A method for examining a layer having defects and in particular the thickness of a machining damaged layer on a surface of a sample by means of a focused ultrasound beam and a device for realizing the method are disclosed, in which a focused ultrasound beam is generated and ultrasound reflected by the sample is detected. Curves (called V(z) curves) representing the relation of the distance between a transducer detecting the reflected ultrasound and the sample versus the detection output are traced while varying the distance and this measurement is repeated while varying the frequency of the focused ultrasound beam. The propagation velocity of surface acoustic wave in the sample is calculated on the basis of the period in each of the plurality of V(z) curves and a frequency dependence characteristic curve for the propagation velocity is obtained. The thickness of the machining damaged layer in the surface portion of the sample is evaluated from inflection points in the frequency dependence characteristic curve.
REFERENCES:
patent: 4541281 (1985-09-01), Chubachi et al.
patent: 4603585 (1986-08-01), Atalar
Curtis, G. J., "The Use of Surface Elastic Waves in Examining Surface Mechanical Properties." In: Szilard, J., Ultrasonic Testing (New York, Wiley, 1982), pp. 302-303. TA 417.4.U4.
Atalar, A. et al., "Phase Imaging in Reflection with the Acoustic Microscope." Applied Physics Letters, vol. 31, No. 12 (Dec. 15, 1977), pp. 791-793.
Ishikawa Isao
Kanda Hiroshi
Katakura Kageyoshi
Chapman John
Hitachi , Ltd.
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