Probe apparatus

Details Probe apparatus Probe apparatus

1993-07-19

1996-05-14

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324754, 324760, G01R 3102

Patent

active

055171265

ABSTRACT:
A probe apparatus for measuring electrical characteristics of an object to be tested by putting a plurality of probes in electrical contact with the object comprises an apparatus body, a probe card having a plurality of probes, and a probe card holder for holding the probe card at a measurement position facing the object. A memory device for memorizing data for measuring the object is provided on the probe card holder.

REFERENCES:
patent: 4649339 (1987-03-01), Grangroth
patent: 5124639 (1992-06-01), Carlin
patent: 5186238 (1993-02-01), del Puerto
patent: 5254939 (1993-10-01), Anderson
patent: 5325052 (1994-06-01), Yamashita

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