Fishing – trapping – and vermin destroying
Patent
1994-04-25
1995-10-24
Chaudhuri, Olik
Fishing, trapping, and vermin destroying
437 48, 437 52, 257315, H01L 21265, H01L 218247
Patent
active
054609887
ABSTRACT:
A method and structure for manufacturing a high-density EPROM or flash memory cell is described. A structure having silicon islands is formed from a device-well that has been implanted with a first conductivity-imparting dopant, over a silicon substrate. A first dielectric layer surrounds the vertical surfaces of the silicon islands, whereby the first dielectric layer is a gate oxide. A first conductive layer is formed over vertical surfaces of the first dielectric layer, and acts as the floating surrounding-gate for the memory cell. A source region is formed in the device-well by implanting with a second and opposite conductivity-imparting dopant to the first conductivity-imparting dopant, and surrounds the base of the silicon islands. A drain region is in the top of the silicon islands, formed by implanting with a second and opposite conductivity-imparting dopant to the first conductivity-imparting dopant. A thin dielectric layer surrounds the silicon islands, over the source region and under the first conductive layer, and acts as a tunnel oxide for the memory cell. A second dielectric layer is formed over vertical surfaces of the first conductive layer, and horizontally over the source region, and is an interpoly dielectric. A second conductive layer is formed over vertical surfaces of the second dielectric layer, and is the control gate for the memory cell.
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"High Performance CMOS Surrounding Gate Transistor (SGT) for Ultra High Density LSIs", by H. Takato et al, IEDM 1988, pp. 222-224.
Ackerman Stephen B.
Booth Richard A.
Chaudhuri Olik
Saile George O.
United Microelectronics Corporation
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