Test device employing scan path having circuitry at switches bet

Details Test device employing scan path having circuitry at switches bet Test device employing scan path having circuitry at switches bet

1996-12-24

1998-12-08

Nguyen, Hoa T.

Excavating

371 2236, G01R 3128

Patent

active

058480757

ABSTRACT:
A test device which employs a scan path method includes a latch circuit for holding a scan in signal, a transfer gate connected between the scan in signal and an input terminal of the latch circuit and having a gate terminal receiving a clock signal, a select circuit for selecting one of a data signal and an output signal from the latch circuit in response to a mode select signal and for outputting the selected signal, and a flipflop circuit for holding an output signal from the select circuit in response to the clock signal and for outputting the held signal as a scan out signal.

REFERENCES:
patent: 4692633 (1987-09-01), Ngai et al.
patent: 4961013 (1990-10-01), Obermeyer, Jr. et al.
patent: 5150366 (1992-09-01), Bardell, Jr. et al.

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