Method of making a semiconductor light-emitting device utilizing

Metal treatment – Process of modifying or maintaining internal physical... – Chemical-heat removing or burning of metal

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29569L, 29578, 29580, 148 15, 148171, 148173, 331 945H, 357 16, 357 17, 357 18, 357 56, 357 59, 427 87, H01L 21203, H01L 2194

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041882440

ABSTRACT:
In order to decrease threshold current of a semiconductor laser, and to obtain a single mode lasing suitable for use in light-communication, the semiconductor laser is formed in stripe type in which the light-emitting (i.e., active) layer and neighboring layers are formed in mesa-etched stripe type and low impurity-concentration (i.e., high resistivity) layers of GaAs, GaAsP or GaAlAs are situated to contact the mesa-etched side faces of the stripe-shaped part on the semiconductor device by vapor phase growth, vacuum deposition, sputtering, or molecular beam deposition. Since the wafer temperature can be kept fairly low (e.g. 400.degree.-700.degree. C.) in comparison with that (about 950.degree. C.) in a liquid phase growth, the stress introduced during the deposition is smaller than that in a liquid phase growth.

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Light et al., "An Integration Approach for Gr" IBM Tech. Discl. Bull., vol. 9, No. 10, Mar. 1967, pp. 1446-1447.
Tsukada, T., "GaAs-GaAlAs Buried-Heterostructure Injection Lasers" J. Applied Physics, vol. 45, No. 11, Nov. 1974, pp. 4899-4906.

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