Interferometer

Details Interferometer Interferometer

1978-03-27

1980-02-12

McGraw, Vincent P.

Optics: measuring and testing

By particle light scattering

With photocell detection

356351, 356360, G01B 902

Patent

active

041881222

ABSTRACT:
A laser beam is split into two components which remain coherent, are differently frequency-shifted, orthogonally polarized and recombined. The recombined beam is expanded and directed into polarization type beam splitter directing one component into a reference branch, the other one into a test branch. Both branches return the component beams which are combined and polarization filtered so that they may interfere on account of local optical path differences. Brightness oscillations are photoelectrically detected in individual points of a plane intercepting the interference beam and referenced as to phase against a reference oscillation derived from a particular point in that plane. The phase differences are electronically acquired point-by-point for generation of a contour map or its equivalent of the optical path differences as between a test object in the test branch and a reference object in the reference branch.

REFERENCES:
patent: 3463924 (1969-08-01), Culshaw et al.
patent: 3877813 (1975-04-01), Hayes et al.
Lavan et al., "Optical Heterodyne Interferometer with Radio-frequency Phase Reference", Applied Optics, vol. 15, No. 11, pp. 2627-2628, 11/76.

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