Two electrode device for determining electrical properties of a

Details Two electrode device for determining electrical properties of a Two electrode device for determining electrical properties of a

1992-09-30

1995-06-20

Regan, Maura K.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

324457, G01R 2726

Patent

active

054263735

ABSTRACT:
A device for determining electrical properties of a dielectric material on a metal substratum is provided. First and second electrodes are suspended in a spaced apart relationship above the dielectric material thereby forming first and second air gaps, respectively, between the electrodes and the dielectric material. A resulting circuit path is formed that includes the first and second electrodes, the first and second air gaps, the dielectric material and the metal substratum. Changes in the measured complex impedance of the circuit path are indicative of the electrical properties of the dielectric material.

REFERENCES:
patent: 3671857 (1972-06-01), Bergmanis et al.
patent: 3805150 (1974-04-01), Abbe
patent: 4106107 (1978-08-01), Goodman
patent: 4806849 (1989-02-01), Kihira et al.
patent: 5223796 (1993-06-01), Waldman et al.
patent: 5309110 (1994-05-01), O'Neill et al.
Journal of Physics vol. 9. Jan. 26, 1976 Baker et al. A Simple Technique Measuring Nonlinear AC Properties of Materials at Frequencies Flow 1Hz.

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