Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
Patent
1974-09-09
1976-12-21
James, Andrew J.
Electrical transmission or interconnection systems
Nonlinear reactor systems
Parametrons
307304, 357 59, 357 65, H01L 2978
Patent
active
039992101
ABSTRACT:
A FET is provided having a linear impedance characteristic over a wide range. It comprises a semiconductor substrate of one impurity type with source and drain regions formed in one surface thereof of opposite highly doped impurity type. An insulating layer overlies said one surface and is of a relative thin thickness between a point above said source region and a point above said drain region, and is of a relative thick thickness throughout the rest of its extent. A polycrystalline resistance layer overlies the insulating layer over its thin thickness portion and over some of the thick portion of the insulating layer lying above the source region. Source and drain electrodes are formed on the insulating layer and have portions thereof extending through windows in the insulating layer into contact with said source and drain regions respectively. A gate electrode is formed on the resistive layer above the thick portion of said insulating layer and extends back from the drain facing face of the source region by a predetermined distance.
REFERENCES:
patent: 3436622 (1969-04-01), Warner
patent: 3676921 (1972-07-01), Kool
patent: 3714522 (1973-01-01), Komiya et al.
C. Hu et al., "A Resistive-Gated IGFET Tetrode," IEEE Trans. on Electron Dev., vol. ED-18, No. 7 July 1971, pp. 418-425.
Clawson Jr. Joseph E.
James Andrew J.
Sony Corporation
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