Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1996-04-19
1998-12-08
Font, Frank G.
Optics: measuring and testing
By polarized light examination
With light attenuation
356376, 25055929, G01B 1124
Patent
active
058478337
ABSTRACT:
Two photodiodes are disposed side by side in the direction in which the slit light reflected from the object to be measured moves. One photodiode 1 of the two photodiodes receives the reflected slit light for a longer period than the other photodiode 2. When neither of the two photodiodes receive the slit light reflected from the object to be measured but both receive the same bias light, even if very weak noise light is incident from the outside or the characteristics of the photodiodes slightly differ, a higher light current flows through the photodiode 1 than through the photodiode 2, making the output of the clock-type comparator 7 stable in the initial state. This allows distance measurement to be always performed stably.
Yokoyama Atsushi
Yoshigahara Takayuki
Font Frank G.
Kananen Ronald P.
Merlino Amanda
Sony Corporation
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