Electrical connectors and IC chip tester embodying same

Electrical connectors – Preformed panel circuit arrangement – e.g. – pcb – icm – dip,... – With provision to conduct electricity from panel circuit to...

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439 66, 439 73, 439 75, 439248, 439525, 439331, 439700, H01R 909, H01R 1362, H05K 100

Patent

active

051278375

ABSTRACT:
A novel wadded wire-plunger contact is provided which possesses excellent durability and desired functional characteristics in a large variety of applications such as the testing of IC chips.

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