Apparatus for testing and producing semiconductor chips and inte

Details Apparatus for testing and producing semiconductor chips and inte Apparatus for testing and producing semiconductor chips and inte

1993-06-25

1995-08-29

Picard, Leo P.

Electricity: electrical systems and devices

Housing or mounting assemblies with diverse electrical...

For electronic systems and devices

361772, 174261, H05K 102

Patent

active

054466245

ABSTRACT:
A probe board is provided with a guide-mask system. The probe board has at least one head which passes through a respective guide-hole located on the filmed guide-mask. The utilization of this guide-mask has the advantage of minimizing slipping of probe heads out of respective mating test terminals of IC chips. Additionally, the utilization of this guide-mask provides accurate probe head positioning and provides enforcement to the heads by way of the filmed guide-mask because of the precise support holes provided in the masks.

REFERENCES:
patent: 3649950 (1972-03-01), Gluntz
patent: 3891898 (1975-06-01), Damon
patent: 4392181 (1983-07-01), Jabben

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