Method of manufacturing a nonvolatile memory including a memory

Fishing – trapping – and vermin destroying

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

437 48, 437978, 257316, H01L 21266, H01L 218247

Patent

active

054459877

ABSTRACT:
A plurality of memory cells have their sources and drains formed integrally with n.sup.+ -buried layers acting as first data lines in a semiconductor substrate. The n.sup.+ -buried layers are connected with second data lines through transfer MISFETs. These transfer MISFETs have their gates made of the same layer of polycrystalline silicon as that of the floating gates of memory cells and are shunted at each predetermined number of bits by Al lines having a lower resistance than that of the polycrystalline silicon. The aforementioned memory cells are made by a method comprising the steps of: forming over a semiconductor substrate sequentially the first gate insulating film, a first conductor layer for the floating gate electrode, an insulating film having at least its uppermost layer of a silicon nitride film for the second gate insulating film, and a damage preventing film of a silicon oxide film; patterning the silicon oxide film, the insulating film and the first conductor layer in a stripe shape; and forming, by ion implantation, an n.sup.+ -buried layer extending in a first direction by using the stripe-patterned silicon oxide film as a mask. As a result, the second gate insulating film can be prevented from having its quality degraded by the damage of the ion implantation.

REFERENCES:
patent: 4043024 (1977-08-01), Iwamatsu
patent: 4420871 (1983-12-01), Scheibe
patent: 5188976 (1993-02-01), Kume et al.
patent: 5210044 (1993-05-01), Yoshikawa
patent: 5296396 (1994-03-01), Bellezza
patent: 5304829 (1994-04-01), Mori et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of manufacturing a nonvolatile memory including a memory does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of manufacturing a nonvolatile memory including a memory , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of manufacturing a nonvolatile memory including a memory will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1819261

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.