Method of forming an apparatus for burn in testing of integrated

Details Method of forming an apparatus for burn in testing of integrated Method of forming an apparatus for burn in testing of integrated

1990-08-30

1992-02-18

Arbes, Carl J.

Metal working

Method of mechanical manufacture

Electrical device making

174254, 357 26, 357 79, 439197, 439513, H01R 906

Patent

active

050881906

ABSTRACT:
An integrated circuit AC test and burn-in socket (10) for communicating test signals between test circuitry and an integrated circuit chip (11) comprises connection circuitry (32) associated to engage the chip (11) and communicate test signals between the chip (11) and the test circuitry. A compliant base (34) supports the circuitry (32) and assures positive engagement and electrical connection between the circuitry (32) and the chip (11). A socket assembly (20 and 21) holds the chip (11) in engagement with the connection circuitry (32).

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patent: 4649339 (1987-03-01), Grangroth et al.
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patent: 4968589 (1990-11-01), Perry

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