Excavating
Patent
1997-02-04
1999-09-07
Nguyen, Hoa T.
Excavating
371 214, G01R 3128, G11C 2900
Patent
active
059497980
ABSTRACT:
Quick detection of CMOS integrated circuit troubles with a simple system is realized. A tester repeatedly applies a test pattern to a CMOS integrated circuit under test, and a power supply unit supplies current through a current detection unit to the CMOS integrated circuit. The current detection unit outputs a detection signal, which is coupled through an amplifier to a power spectrum analyzing unit to derive its power spectrum. When the CMOS integrated circuit has a trouble, a quiescent supply current which is set apart from the transistor switching current is caused in specific sub-patterns in the test pattern for every (NT+T.sub.0) seconds. A checking unit detects the power of the detection signal in the current, i.e., checks for a trouble in the CMOS integrated circuit under test.
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NEC Corporation
Nguyen Hoa T.
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