Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1997-07-08
1999-09-07
Nguyen, Vinh P.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324765, G01R 3102
Patent
active
059492414
ABSTRACT:
A method for testing an interconnect for a bare semiconductor die is provided. The method includes: assembling the interconnect and die in a temporary package; applying a bias voltage between a conductor and a substrate of the interconnect; and then detecting leakage current from the conductor to the substrate or to another conductor. A current sensing circuit makes an electrical connection with each conductor and with the substrate for the interconnect. The current sensing circuit then applies a bias voltage to the conductors and detects any resultant leakage current. The electrical connection with the substrate can be with a spring loaded connector operating through a hole in a base of the temporary package, or with a conductive member formed on the temporary package in electrical communication with a dedicated external lead.
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Akram Salman
Farnworth Warren M.
Gratton Stephen A.
Micro)n Technology, Inc.
Nguyen Vinh P.
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