Test head apparatus for use in electronic device test equipment

Details Test head apparatus for use in electronic device test equipment Test head apparatus for use in electronic device test equipment

1996-10-31

1999-09-07

Karlsen, Ernest

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

3241581, 324758, G01R 3102, G01R 1073

Patent

active

059492392

ABSTRACT:
A test head apparatus for use in electronic device test equipment includes a test head with an annular test head body including a probe card carrier attachment region of a first circumference and a test electronic card storage region with a second circumference greater than the first circumference. The probe card carrier attachment region of the test head body is compatible with probe card carriers for existing test heads. The enlarged test electronic card storage region provides more space for electronic equipment, while providing more viewing area of the probe card. The apparatus also includes an improved probe card attachment configuration.

REFERENCES:
patent: 3866119 (1975-02-01), Ardezzone
patent: 4673839 (1987-06-01), Veenendaal
patent: 4862075 (1989-08-01), Choi et al.
patent: 4918383 (1990-04-01), Huff et al.
patent: 5321453 (1994-06-01), Mori
patent: 5489853 (1996-02-01), Nakajima
patent: 5559446 (1996-09-01), Sano
patent: 5747994 (1998-05-01), Suga

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