Fishing – trapping – and vermin destroying
Patent
1987-10-20
1989-04-04
Hearn, Brian E.
Fishing, trapping, and vermin destroying
437 33, 437 90, 148DIG10, 148DIG117, 357 34, H01L 21205, H01L 2176, H01L 21265
Patent
active
048187135
ABSTRACT:
Submicron resolution in the fabrication of transistors is obtained by using sidewall techniques. The techniques described remove the sidewalls after oxidizing the materials between the sidewalls and the openings so formed by the removal are used as a mask for subsequent substrate modification by either diffusion or ion implantation.
REFERENCES:
patent: 3833429 (1974-09-01), Monma et al.
patent: 4236294 (1980-12-01), Anantha et al.
patent: 4309812 (1982-01-01), Horng et al.
patent: 4338138 (1982-07-01), Cavaliere et al.
patent: 4592792 (1986-06-01), Corboy, Jr. et al.
patent: 4640721 (1987-02-01), Uehara et al.
patent: 4641416 (1987-02-01), Iranmanesh et al.
patent: 4678537 (1987-07-01), Ohuchi
patent: 4698316 (1987-10-01), Corboy, Jr. et al.
patent: 4728624 (1988-03-01), Silvestri et al.
patent: 4729965 (1988-03-01), Tamaki et al.
patent: 4749441 (1988-06-01), Christenson et al.
patent: 4758530 (1988-07-01), Schubert
patent: 4758531 (1988-07-01), Beyer et al.
patent: 4760036 (1988-07-01), Schubert
Ghandhi, VLSI Fabrication Principles, John Wiley and Sons, 1983, pp. 373, 421-423, 434-435.
Prospects of SST Technology for High Speed LSI, T. Sakai et al., IEDM, '85, pp. 18-21.
American Telephone and Telegraph Company AT&T Bell Laboratories
Hearn Brian E.
Koba Wendy W.
Wilczewski M.
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