Reduction of contact resistance in CMOS integrated circuit chips

Metal treatment – Stock – Ferrous

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

29590, 29576R, 148 15, 148187, 148191, H01L 21324

Patent

active

045161453

ABSTRACT:
A process for forming the openings (vias) in the glass layer of complementary metal oxide semiconductor (CMOS) integrated circuit chips is presented. The pattern of openings is applied to the glass layer using conventional resist/mask techniques. A plasma is used to remove the glass, and the silicon dioxide layer, if there is one, to expose a portion of the N+ and P+ circuit elements. Decreased conductivity of the crystalline lattice structure of the N+ material, caused by exposure to the plasma, appears as an added resistor between the N+ material and the metallization layer. The added resistance is reduced to acceptable levels before the metallization layer is applied by placing the chip in an inert gas atmosphere at an appropriate elevated temperature for an appropriate time.

REFERENCES:
patent: 3475234 (1969-10-01), Kerwin et al.
patent: 3615873 (1971-10-01), Sluss, Jr. et al.
patent: 4116719 (1978-09-01), Shimizu et al.
patent: 4125426 (1978-11-01), Inayoshi et al.
patent: 4297149 (1981-10-01), Koons et al.
patent: 4348802 (1982-09-01), Shirato
patent: 4420503 (1983-12-01), Leung et al.
patent: 4459159 (1984-07-01), O'Mara
patent: 4476621 (1984-10-01), Bopp et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Reduction of contact resistance in CMOS integrated circuit chips does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Reduction of contact resistance in CMOS integrated circuit chips, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Reduction of contact resistance in CMOS integrated circuit chips will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1803001

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.