Integrated circuit device test socket

Details Integrated circuit device test socket Integrated circuit device test socket

1993-08-16

1994-11-01

Desmond, Eugene F.

Electrical connectors

Preformed panel circuit arrangement, e.g., pcb, icm, dip,...

With provision to conduct electricity from panel circuit to...

439330, 439487, H01R 448

Patent

active

053603486

ABSTRACT:
A test socket for testing of semiconductor devices. The socket includes a plurality of electrical contacts mounted within a housing, a cover, and a pressure applicator which serve to prolong test life of the contacts. The pressure applicator is mounted to the cover by use of an elastomeric element which compliantly holds the applicator to the cover. The socket construction, thereby, serves to prevent damage to leads of an integrated circuit device held by the socket.

REFERENCES:
patent: 4758176 (1988-07-01), Abe et al.
patent: 5100332 (1992-03-01), Egawa
patent: 5266037 (1993-11-01), Hetzel et al.

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