Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
Patent
1983-07-14
1987-04-14
Miller, Stanley D.
Electrical transmission or interconnection systems
Nonlinear reactor systems
Parametrons
328114, 307234, 307265, H03K 522, H03K 3017
Patent
active
046582169
ABSTRACT:
A pulse processing system (10) for use in an X-ray spectrometer in which a ain channel pulse shaper (12) and a fast channel pulse shaper (13) each produce a substantially symmetrical triangular pulse (f, p) for each event detected by the spectrometer, with the pulse width of the pulses being substantially independent of the magnitude of the detected event and with the pulse width of the fast pulses (p) being substantially shorter than the pulse width of the main channel pulses (f). A pile-up rejector circuit (19) allows output pulses to be generated, with amplitudes linearly related to the magnitude of the detected events, whenever the peak of a main channel pulse (f) is not affected by a preceding or succeeding main channel pulse, while inhibiting output pulses wherein peak magnitudes of main channel pulses are affected by adjacent pulses. The substantially symmetrical triangular main channel pulses (f) are generated by the weighted addition (27-31) of successive RC integrations (24, 25, 26) of an RC differentiated step wave (23). The substantially symmetrical triangular fast channel pulses (p) are generated by the RC integration ( 43) of a bipolar pulse (o) in which the amplitude of the second half is 1/e that of the first half, with the RC time constant of integration being equal to one-half the width of the bipolar pulse.
REFERENCES:
patent: 3413412 (1968-11-01), Towsend
patent: 3528019 (1970-09-01), Inoue
patent: 3555434 (1971-01-01), Sheen
patent: 3705358 (1972-12-01), Bauman et al.
patent: 3735271 (1973-05-01), Leibowitz
patent: 4497068 (1985-01-01), Fischer
Goulding Frederick S.
Landis Donald A.
Callahan Timothy P.
Clouse, Jr. Clifton E.
Gaither Roger S.
Hightower Judson R.
Miller Stanley D.
LandOfFree
High resolution, high rate X-ray spectrometer does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with High resolution, high rate X-ray spectrometer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and High resolution, high rate X-ray spectrometer will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1788574