Method of and apparatus for real-time high-speed inspection of o

Details Method of and apparatus for real-time high-speed inspection of o Method of and apparatus for real-time high-speed inspection of o

1983-03-21

1986-05-13

Boudreau, Leo H.

Image analysis

Histogram processing

For setting a threshold

382 14, 382 27, 358106, G06K 962

Patent

active

045891400

ABSTRACT:
This disclosure is concerned with real-time high-speed inspection of objects involving storing digital signal mask information of optical scans of objects at different magnifications, but with substantially the same field of view, and comparing digital mask information obtained by run scans of objects-to-be-inspected, at different magnifications, with the stored mask information to identify known or unknown portions of the objects, with adaptability for rapid "teaching" of large sets of objects for storage and subsequent comparison with real objects under inspection.

REFERENCES:
patent: 3887762 (1975-06-01), Uno et al.
patent: 4014000 (1977-03-01), Uno et al.
patent: 4345312 (1982-08-01), Yasuye et al.
Arlan et al, "High-Resolution Computer-Controlled TV System for Hybrid Circuit Inspection", Proc. of SPIE, vol. 182, Apr., 1979, pp. 130-139.
Automatix, Autovision II Programmable Visual Inspection System, 1981.
Machine Intelligence Corp., Model VS-100 Machine Vision System.
Robert C. Rastrick, III, S.P.I.E. Solid State Imaging Devices, vol. 116, pp. 76-81, "An Automatic Optical Printed Circuit Inspection System", 1977.
Dan Antonsson et al, "A System for Automatic Visual Inspection of Printed Circuit Boards", 1979.
Masakazu Ejiri et al, "A Process for Detecting Defects in Complicated Patterns", Comp. Graphics & Image Process, vol. 2, 1973, pp. 326-339.

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