High throughput circuit tester and test technique avoiding overd

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

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324 73R, 364481, 371 20, 371 25, G01R 1512

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active

045889457

ABSTRACT:
A method and apparatus are disclosed for reducing the likelihood of damage to digital logic devices under test or located in close electrical proximity to the device under test while attempting to locate faults in circuit assemblies using digital incircuit test techniques.

REFERENCES:
patent: 3870953 (1975-03-01), Boatman et al.
patent: 4507576 (1985-03-01), McCracken et al.
Hansen, P., "Functional and In-Circuit Testing . . . ", Electronics, Apr. 21, 1981, pp. 189-195.
Carrol, M. et al., "In Circuit Tester Takes on ECL, TTL, and MOS Devices", Electronic Design, vol. 29, No. 11, May 1981, pp. 91-97.
Tom E. Finnell, "In-Circuit Testing of LSI-Based PCBs", Electronic Production, Sep. 1982, p. 47.

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