Semiconductor test equipment

Details Semiconductor test equipment Semiconductor test equipment

1995-04-04

1997-01-07

Beausoliel, Jr., Robert W.

Excavating

371 221, 371 251, 371 24, 3241581, G01R 3128, G06F 1100

Patent

active

055924964

ABSTRACT:
A semiconductor test equipment for testing a semiconductor device which is capable of reducing the cost and size is disclosed. The semiconductor test equipment includes a main clock generator for generating a main clock signal having the highest frequency, a first pattern generator which receives the main clock signal for generating a first test pattern signal, a clock divider which divides the main clock signal to generate a lower frequency clock signal, and a second pattern generator which receives the lower frequency clock for generating a second test pattern. The semiconductor test equipment further includes a first wave formatter which receives the first pattern signal for forming a predetermined wave shape, and a second wave formatter which receives the second pattern signal for forming a predetermined wave shape, a first comparator circuit which receives a first output signal from the device under test and compares the first output signal with a first expected pattern from the first pattern generator, and a second comparator circuit which receives a second output signal from the device under test and compares the second output signal with a second expected pattern from the second pattern generator.

REFERENCES:
patent: 4497056 (1985-01-01), Sugamori
patent: 5018145 (1991-05-01), Kikuchi et al.
patent: 5127011 (1992-06-01), Combs et al.
patent: 5142223 (1992-08-01), Higashino et al.
patent: 5153883 (1992-10-01), Hayashi et al.
patent: 5390192 (1995-02-01), Fujieda
patent: 5432797 (1995-07-01), Takano

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