Optics: measuring and testing – By polarized light examination
Patent
1991-09-26
1993-07-20
Rosenberger, Richard A.
Optics: measuring and testing
By polarized light examination
356128, 356352, G01N 2117
Patent
active
052298337
ABSTRACT:
An optical sensor includes a resonant mirror device 1, and a prism 2 disposed adjacent the device for coupling a beam of light into the device 1. The device 1 and the prism 2 are mounted on a rotatable platform. A beam of light is produced by He-Ne laser 3 and is linearly polarized with equal TE and TM components by a polarizer 4 arranged at 45.degree. to TE and TM axis. A lens 6 is arranged in the path of the linearly polarized beam of light for focussing the beam of light onto the device thereby providing simultaneously a range of angles of incidence at which the beam of light can be coupled into said device. The platform on which the device 1 and the prism 2 are mounted, is rotated to a position, at which the angle of incidence of beam of light coupled into the device is such that a resonance is excited in said device for at least one of said components. The beam of light reflected from the device is passed through an analyser 11 arranged at 90.degree. to the polarizer 4. On resonance of one or both components, one component is phase shifted to the other between 0 and 2 radians. The beam in this case will be elliptically polarized light and at least a component of light will be passed by the analyser 11 and will be projected as a bright band on a viewing plane. When the phase shift is radian, the beam is linearly polarized, but in the plane of the transmission axis of the analyser and so all the light is transmitted by the analyser.
REFERENCES:
patent: 5076696 (1991-12-01), Cohn et al.
Murray, Thomas P. "Automatic Optical Thickness Gauge for Thin Film Measurements", The Review of Scientific Instruments. vol. 33, No. 2 (Feb. 1962). pp. 172-176.
GEC--Marconi Limited
Rosenberger Richard A.
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