Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type
Patent
1997-07-18
1999-05-18
Mai, Huy
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Objective type
351205, A61B3/14
Patent
active
059055626
ABSTRACT:
In an ophthalmic apparatus for measuring an eye to be examined, an picture image photographed by a TV camera is processed by image processing circuit, and a position of alignment target image is detected so as to detect an alignment condition of measuring unit opposite to the eye to be examined. The suitability of the alignment condition is judged by a microcomputer, and when it is judged that the alignment condition is proper, a trigger signal is generated so as to start a measurement. Upon the measurement or after the measurement is completed, in case that the alignment condition is detected, the suitability of the alignment condition is judged, and it is judged that the alignment condition deviates from a predetermined allowable condition, a measured result which is obtained by a measurement performance is cancelled, or the measured result is corrected based on a detected result by an alignment detection. The apparatus continues the measurement by generating the trigger signal based on the suitable judged result of the alignment condition until the measured results of predetermined times are obtained, and when the measured results of predetermined times are obtained, a generation of trigger signal is stopped, so that it is monitored whether an alignment target image is not detected within a predetermined period. By this monitoring, when the target is not detected within the predetermined period, it is cancelled that the trigger signal is stopped generating.
REFERENCES:
patent: 5406076 (1995-04-01), Mimura et al.
patent: 5463430 (1995-10-01), Isogai et al.
patent: 5644375 (1997-07-01), Suzuki
patent: 5696573 (1997-12-01), Miwa
Isogai Naoki
Kawai Noriji
Mai Huy
Nidek Co. Ltd.
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