Fishing – trapping – and vermin destroying
Patent
1991-08-13
1993-07-20
Chaudhuri, Olik
Fishing, trapping, and vermin destroying
437946, 134 3, 134 254, 134 28, H01L 21306, B08B 308
Patent
active
052293343
ABSTRACT:
A method of producing a semiconductor device which comprises; a first cleaning step of cleaning the surface of Si of a semiconductor device having an Si base or an Si thin film as a substrate (1) by using an APM solution; a second cleaning step of cleaning the surface of Si by using a dilute HF solution to thereby remove the uppermost surface layer (3) of a naturally oxidized film (2) formed in the first cleaning step; and a step of forming a silicon oxide film by thermally oxidizing the cleaned surface of the naturally oxidized film (2).
REFERENCES:
patent: 3158517 (1964-11-01), Schwarzenberger
patent: 4264374 (1981-04-01), Beyer et al.
patent: 4867799 (1989-09-01), Grebinski
Moslehi et al., "Interfacial and breakdown characteristics of MOS Devices with rapidly grown Ultrathin SiO.sub.2 Gate Insulators", IEEE Transactions on Electron Devices, vol. ED-34, No. 6, Jun. 1987, pp. 1907-1910.
Wiget et al., "The Influence of Cleaning on SiO.sub.2 Growth", ESSDERC '89 European Solid State Devices Research Conference, Sep. 11, 1989, pp. 370-373.
Shimizu et al., "Effects of Dipping in an Aqueous Hydrofluoric Acid Solution before Oxidation on Minority Carrier Lifetimes in p-Type Silicon Wafers", Japanese Journal of Applied Physics, vol. 28, No. 5.I, May 1989, pp. 743-747.
Hisas, "Thin Film Etching System on Semiconductor Base Plate", Patent Abstracts of Japan, vol. 1, No. 86(E-035) Aug. 11, 1977, (JP-Ap-52022881).
Tatsuro, "Manufacture of Semiconductor Device", Patent Abstracts of Japan, vol. 12, No. 285(E-642), Aug. 4, 1988, (JP-A-63062329).
Watanabe et al., "The Role of Atmospheric Oxgen and Water in the Generation of Water Marks on the Silicon Surface in Cleaning Processes", Materials Science & Engineering, vol. B4, No. 1/4, Oct. 1989, pp. 401-405.
Jiyunji; "Semiconductor Substrate Cleaning Device", Patent Abstracts of Japan, vol. 9, No. 332(E-370), Dec. 26, 1985, JP-A-60163434).
Koji, "Processing of Semiconductor Device", Patent Abstracts of Japan, vol. 11, No. 338(E-53) Nov. 5, 1987, (JP-A-62118528).
Yoshio, "Production of Silicon Dioxide Thin Film", Patent Abstracts of Japan, vol. 4, No. 61(C-009), May 8, 1980, (JP-A-55027854).
Kern, "The Evolution of Silicon Wafer Cleaning Technology", J. Electrochem. Soc. vol. 137, No. 6, Jun. 1990, pp. 1887-1892.
Beyer, "Silicon Surface Cleaning Process", IBM Tech. Disc. Bull., vol. 20, No. 5, 1977, pp. 1746-1747.
Meek et al., "Silicon Surface Contamination: Polishing and Cleaning", J. Electrochem. Soc.: Solid State Science and Technology, vol. 120, No. 9, Sep. 1973, pp. 1291-1246.
Chaudhuri Olik
Ojan Ourmazd S.
Seiko Epson Corporation
LandOfFree
Method of forming a gate insulating film involving a step of cle does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of forming a gate insulating film involving a step of cle, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming a gate insulating film involving a step of cle will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1760333