Fishing – trapping – and vermin destroying
Patent
1992-01-14
1993-11-02
Fourson, George
Fishing, trapping, and vermin destroying
437 71, 437966, 148DIG116, H01L 2176
Patent
active
052583228
ABSTRACT:
A method of producing a semiconductor substrate, which comprises forming a monocrystalline silicon layer on a porous silicon substrate by epitaxial growth and applying an oxidation treatment to the porous silicon substrate and the monocrystalline silicon layer at least near the interface between the porous silicon substrate and the monocrystalline silicon layer.
REFERENCES:
patent: 5098850 (1992-03-01), Nishida et al.
Wolf, S. et al, Silicon Processing for the VLSI Era, vol. 1: Process Technology (1986) pp. 216-218.
Wolf, S., Silicon Processing for the VLSI Era, vol. 2: Process Integration (1990) pp. 76-77.
Imai, et al., "Crystalline Quality of Silicon Layer Formed By Technology." Journal of Crystal Growth 63 (1983) 547-553.
Uhlir, "Electrolytic Shaping of Germanium and Silicon." The Bell System Technical Journal, vol. XXXV, 1956, pp. 333-347.
Unigami, "Formation of Mechanism of Porous Silicon Layer by Anodization in HF Solution." Jour. of the Electrochemical Soc. vol. 127, No. 2, Feb. 1980, pp. 476-482.
Imai, "A New Dielectric Isolation Method Using Porous Silicon." Solid-State Electronics, vol. 24, No. 2, Feb. 1981, pp. 159-164.
Holstrom and Chi, "Complete Dielectric Isolation by Highly Selective and Self-Stopping Formation of Oxidized Porous Silicon." Appl. Phys. Lett., vol. 42, No. 4, Feb. 13, 1983, pp. 386-388.
Takai and Itoh, "Porous Silicon Layers and its Oxide for the Silicon-on-Insulator Structure." Appl. Phys. Lett. Jul. 1, 1986, pp. 222-225.
Tsubouchi et al., "Oxidation of Silicon in High-Pressure Steam." Japanese Journal of Applied Physics, vol. 16, No. 5, May 1977, pp. 855-856.
"Single-Crystal Silicon On Non-Single-Crystal Insulators," edited by G. W. Cullen, Journal of Crystal Growth, vol. 63, No. 1, Oct. 1, 1983, pp. 429-590.
Sakaguchi Kiyofumi
Yonehara Takao
Canon Kabushiki Kaisha
Fourson George
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