Stroboscopic type potential measurement device

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

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250310, G01R 1900, G01R 3102

Patent

active

047728477

ABSTRACT:
A stroboscopic type potential measurement device is disclosed, in which a waveform of a periodically varying voltage at a location irradiated with a charged particle pulsed beam is measured by using the charged particle pulsed beam synchronized with a periodically varying voltage in a sample and varying the relation in the phase between the periodically varying voltage in the sample and the charged particle pulsed beam. In order to reproduce a potential waveform, which is close to the original waveform, two sorts of measurements having different phase division pitches are effected and a measurement result is formed by combining a measurement result obtained by using a coarse phase division and that obtained by using a fine phase division. A phase scanning with the coarse phase division pitch is repeated for every fine phase division pitch.

REFERENCES:
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patent: 3771056 (1973-11-01), Zimmerman
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patent: 3896390 (1975-07-01), Bumgardner
patent: 3965744 (1976-06-01), Gutjahr
patent: 4134029 (1979-01-01), Bright et al.
patent: 4370643 (1983-01-01), Kitamura
patent: 4602243 (1986-07-01), Von Bergen et al.
patent: 4620136 (1986-10-01), Bolger
patent: 4625286 (1986-11-01), Papamichalis et al.
"Stroboscopic Scanning Electron Microscope with 1 KeV Electrons", by Tokodoro et al. Scan. Elect. Micros., 1983., pp. 561-8.
"Quantitative Measurement with High Time Resolution of Internal Waveforms on MOS RAM's Using a Modified Scanning Electron Microscope", by Feuerbaum et al., IEEE, vol. SC-13, Journal of Solid-St. Ckts., #3, 6/78, pp. 319-325.

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