Method of and device for measuring life time of carriers of semi

Details Method of and device for measuring life time of carriers of semi Method of and device for measuring life time of carriers of semi

1974-07-24

1976-02-17

Smith, Alfred E.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 58B, 324158R, G01R 3126, G01R 2706

Patent

active

039394158

ABSTRACT:
There is disclosed a method of and device for measuring characteristics of a semiconductor by way of a microwave. The variation with time in the concentration of carriers which are produced in the semiconductor by applying an energy thereto from an external energy source such as light source is measured by way of a reflected microwave of an incident microwave directed to a portion of the semiconductor through a tapering antenna, whereby the life time of carriers in the semiconductor is determined.

REFERENCES:
patent: 2859407 (1958-11-01), Henisch
patent: 3206674 (1965-09-01), Thuy et al.
patent: 3500204 (1970-03-01), Stromer

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