Electron beam ionization signal sampler

Details Electron beam ionization signal sampler Electron beam ionization signal sampler

1975-04-17

1976-07-13

Zazworsky, John

328108, 328124, 328126, 328151, G11C 1126, H03K 500

Patent

active

039696766

ABSTRACT:
A signal sampler based on electron ionization principles, and having a cade ray tube including an electron gun and deflection plates, and several semiconductor targets positioned near the face of the CRT. The input signal is applied to the grid of the tube and modulates the intensity of the electron beam emitted by the electron gun. The targets are illuminated by the beam and the current produced is proportional to the electron density. By this method, wherein the beam is swept across the targets, and the input pulse is used to control the intensity of the beam, only one sweep is required to fully investigate the pulse. Investigation is accomplished by detecting and processing the current produced at each target.

REFERENCES:
patent: 3506971 (1970-04-01), Sakurai

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