Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1989-01-17
1989-10-17
Rosenberger, Richard A.
Optics: measuring and testing
By polarized light examination
With light attenuation
G01B 1124
Patent
active
048742465
ABSTRACT:
An optical distance or profile meter in which radiation reflected from a surface (630) is projected onto a radiation-sensitive dectection system via an optical system (641, 642) comprises a radiation-blocking plate (250) formed with radiation windows (651). The radiation-blocking plate only transmit radiation which is reflected from the surface at an angle relative to the optical axis of the optical system. The extent of the pattern of radiation spots thus formed on the detection system is a measure of the distance (.DELTA.h) from the surface. The detection system may comprise a semitransparent filter(660) whose transmission coefficient exhibits a position-dependent variation. This enables the radiation-sensitive element to be constructed as a single element (661) and the effects of speckle noise to be reduced substantially.
REFERENCES:
patent: 3606541 (1971-09-01), Sugano et al.
patent: 4548504 (1985-10-01), Morander
patent: 4595271 (1986-06-01), Suda et al.
patent: 4645347 (1987-02-01), Rioux
patent: 4677302 (1987-06-01), Chui et al.
Botjer William L.
Rosenberger Richard A.
U.S. Philips Corp.
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