Optical level

Details Optical level Optical level

Filed on

1983-02-02

Date issued

1986-07-15

Examiner

Rosenberger, R. A.

Patent Class

Optics: measuring and testing

SubClass

Angle measuring or angular axial alignment

Other Related Categories

356374, 356376, G01B 1114

Type

Patent

Status

active

Patent number

046003045

Description

ABSTRACT:
An optical instrument arrangement for determining the horizontality of a measured surface, where the arrangement comprises a solid reflecting device on a measured surface, a liquid reflecting device on a measured surface, a collimated light source positioned to direct collimated light beams onto both the solid reflecting device and the liquid reflecting device, a device for generating a first Moire fringe pattern from the solid light reflecting device and for also generating a second Moire pattern from the liquid reflecting device; and a device for simultaneously viewing the first and second Moire patterns to determine the horizontality of the measured surface from the shift of the second Moire pattern relative to the first Moire pattern.

REFERENCES:
patent: 2811074 (1957-10-01), Davidson
patent: 3245307 (1966-04-01), De Lang
patent: 3520621 (1970-07-01), Blesch et al.
patent: 3706494 (1972-12-01), Gardner
patent: 4459027 (1984-07-01), Kafri et al.
Kawara, "Corneal Topography Using Moire Contour Fringes", Applied Optics, vol. 18, No. 21, 11/1/79 pp. 3675-3678.
Theocaris et al., Slope Measurement by Means of Moire Fringes, Journal of Scientific Instrumentation, 1965 vol. 42, No. 8, pp. 607-610.
Fry et al., Analyzing Rapid Surface Motions with Moire Fringes, Proceedings of the 12th International Congress on High Speed Photography, Aug. 1976.

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