Dynamically controlling the number of boundary-scan cells in a b

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G06F 1100

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057682895

ABSTRACT:
A method and apparatus for dynamically configuring the number of boundary-scan cells in a boundary-scan path is disclosed. A plurality of control signals is asserted to a plurality of boundary-scan cells in a boundary-scan path. Each control signal of the plurality of control signals is in a first state or a second state. For each control signal that is in a first state, a respective one of the plurality of boundary-scan cells is bypassed in the boundary-scan path.

REFERENCES:
"Boundary-Scan Architecture and IEEE Std 1149.1", Texas Instruments, pp. 3-1 through 3-15, 1990.
"Boundary-Scan Test, A Practical Approach", Bleeker, et al., Kluwer Academic Publishers, pp. 1-84.
"IEEE Standard Test Access Port and Boundary-Scan Architecture", IEEE Std. 1149.1-1990 (includes IEEE std 1149.1a-1993, pp. iii-XV and XVii, 1-1 through A-12, 1990.
"Introduction To On-Board Programming with Intel Flash Memory", pp. 1-9, Peter T. Larsen, Intel .RTM. Application Note AP-624 Mar. 1996.
"Simplify Manufacturing By Using Automatic-Test-Equipment For On-Board Programming", Peter T. Larsen, pp. 1-15, Intel .RTM. Application Note AP-629, Jun. 1996.
"Designing For On-Board Programming Using The IEEE 1149.1 (JTAG) Access Port", pp. 1-15, Peter T. Larsen, Intel .RTM. Application Note AP-630, Aug. 1996.

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