Short-width pulse generating apparatus for measurement of reflec

Details Short-width pulse generating apparatus for measurement of reflec Short-width pulse generating apparatus for measurement of reflec

1996-02-21

1998-06-16

McGraw, Vincent P.

Optics: measuring and testing

For optical fiber or waveguide inspection

324534, 327369, G01N 2188, G03K 17968

Patent

active

057679550

ABSTRACT:
A short-width pulse generating apparatus for use in measurement of a reflection point, a sampling apparatus for use in measurement of a a reflection point, and a reflection point measuring apparatus each being able to specify a reflection position produced in an integrated high-frequency circuit or a reflection point produced in the inside of an optical element with high accuracy are provided. A short-width pulse generation apparatus comprises short-width optical pulse generating means for generating an optical probe pulse having a narrow pulse width and photoelectric conversion means for producing a short-width electric pulse on a signal transmission line when irradiated with an optical probe pulse, and a sampling apparatus comprises variable delay means for sequentially delaying an optical probe pulse and second photoelectric conversion means for sampling an electric potential on the signal transmission line by being irradiated with an optical probe pulse delayed by the variable delay means. A reflection point measuring apparatus comprises a combination of the short-width pulse generating apparatus and the sampling apparatus.

REFERENCES:
patent: 3558920 (1971-01-01), Giaever
Danielson et al "Guided -Wave Reflectometry, With Micrometer Resolution" Applied Optics vol. 26 No. 14, 15 Jul. 1987, pp. 2836-2842 copy 356173.1.

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