Semiconductor device with test circuit for high accuracy chip te

Details Semiconductor device with test circuit for high accuracy chip te Semiconductor device with test circuit for high accuracy chip te

1998-05-05

2000-11-28

Callahan, Timothy P.

Miscellaneous active electrical nonlinear devices, circuits, and

Signal converting, shaping, or generating

Synchronizing

327161, 331 17, H03L 700

Patent

active

061540749

ABSTRACT:
By providing a test circuit including a reference timing generator, a phase error detector, and a comparator, the output signal of the comparator is set in response to the timing of level change of the result of processing of the functional circuit. The phases of the reference pulse generated by the reference timing generator using a control signal as a trigger and the output signal of the comparator by the phase error detector are compared, and the level of a judging signal is set according to the result of the comparison. The judging signal is held temporally by a register, then output to an output pin through a buffer. Using a selector, the held signal of the register is output during the test operation, while the result of processing of the functional circuit is output during normal operation. As a result, it is possible to detect the quality of the chip without using an expensive LSI tester.

REFERENCES:
patent: 4066969 (1978-01-01), Pearce et al.
patent: 4974234 (1990-11-01), Brandt
patent: 5097489 (1992-03-01), Tucci
patent: 5351091 (1994-09-01), Hosoya et al.
patent: 5636254 (1997-06-01), Hase et al.

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