High performance probe interface for automatic test equipment

Details High performance probe interface for automatic test equipment High performance probe interface for automatic test equipment

1998-03-24

2000-03-14

Do, Diep N.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324761, G01R 3102

Patent

active

060377879

ABSTRACT:
A probe interface device is disclosed that includes a plurality of coaxial contact probe assemblies disposed in an insulative base. Each coaxial contact probe assembly includes a solid tubular shield with a coaxial signal contact probe, which is isolated from the shield by an insulative retainer; and, a solid tubular reference with another coaxial contact probe. The shield and the reference are soldered together at their respective ends. Further, the insulative base includes an upper retainer and a lower retainer attached to a hollow frame. The upper and lower retainers are provided with the same number of holes for engaging a plurality of coaxial contact probe assemblies. The probe interface device can be used for testing mixed-signal devices and is easy to manufacture.

REFERENCES:
patent: 4138643 (1979-02-01), Beck et al.
patent: 4574236 (1986-03-01), Hechtman
patent: 4740746 (1988-04-01), Pollock et al.
patent: 4812745 (1989-03-01), Kern
patent: 5068602 (1991-11-01), Mielke
patent: 5116244 (1992-05-01), Cartier

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