Semiconductor integrated circuit device and fabrication method t

Metal working – Method of mechanical manufacture – Assembling or joining

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

148 15, 29576W, 427 93, 156653, 156657, H01L 2176

Patent

active

045022011

ABSTRACT:
The invention discloses a semiconductor integrated circuit device characterized in that an inverse transistor element portion and a normal transistor element portion are formed in a common semiconductor layer and are separated from each other by an oxide layer penetrating said semiconductor layer in the direction of its thickness. In particular, in order to attain improved characteristics for the respective devices, the semiconductor layer of the inverse transistor element portion is thinner than the semiconductor layer of the normal transistor element portion.

REFERENCES:
patent: 3962717 (1976-06-01), O'Brien
patent: 4157268 (1979-06-01), Bergeron

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor integrated circuit device and fabrication method t does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor integrated circuit device and fabrication method t, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor integrated circuit device and fabrication method t will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1727221

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.