Digital-to-analog converter test method and apparatus

Details Digital-to-analog converter test method and apparatus Digital-to-analog converter test method and apparatus

1996-06-10

1997-05-20

Young, Brian K.

Coded data generation or conversion

Analog to or from digital conversion

Digital to analog conversion

341120, H03M 110

Patent

active

056316496

ABSTRACT:
A method and apparatus for testing the linearity of a digital-to-analog converter that uses equally-weighted signal sources to convert high-order bits of digital input, and unequally-weighted signal sources to convert low-order bits. Minimum and maximum digital inputs are supplied, and a linear input-output characteristic is calculated from the two resulting analog output values. The nonlinearity error is calculated by finding the deviations from this linear input-output characteristic of two sets of analog output values: one set obtained by varying the high-order bits while holding the low-order bits constant; the other set obtained by varying the low-order bits while holding the high-order bits constant.

REFERENCES:
patent: 4137525 (1979-01-01), Tyrrel
patent: 4335373 (1982-07-01), Sloanne
"Measuring Methods of Linear Analog-To-Digital Converters and Digital-To-Analog Converters", EIAJ, Technical Committee on Integrated Circuits, Dec., 1994 ED-5104 (pp. 20-26).

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