Electrical probe apparatus

Geometrical instruments

Patent

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Details

339255R, 324158F, 324158P, H01R 1324, G01R 106

Patent

active

044038224

ABSTRACT:
An electrical probe apparatus for facilitating the testing of printed circuit boards is constructed in a gas tight manner. This allows the printed circuit board to be held by suction without losing vacuum pressure through the probe. A silicon rubber sleeve serves as the vacuum seal, and its resilience urges the probe into firm contact with the circuit under test.

REFERENCES:
patent: 2438350 (1948-03-01), Reichard
patent: 2515004 (1950-07-01), Haupt
patent: 2682649 (1954-06-01), Blonder
patent: 2742626 (1956-04-01), Collins et al.
patent: 3411125 (1968-11-01), Hill
patent: 4017793 (1977-04-01), Haines
patent: 4298239 (1981-11-01), Montalto et al.

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