Processor apparatus and method for a process measurement signal

Boots – shoes – and leggings

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

364550, 3408546, 3408554, 356445, 356229, G10K 1100

Patent

active

058416668

ABSTRACT:
An apparatus and method for processing a time domain reflectometry (TDR) signal to generate an output result corresponding to a valid process variable. The method includes the steps of processing the TDR signal using at least two different techniques for detecting a valid reflection pulse generated by the process variable to calculate an independent result using each of the at least two techniques, and applying a weighted factor to the independent results from each of the at least two different techniques to provide weighted output results. The method also includes the steps of comparing the weighted output results, and selecting the valid output result from the weighted output results based on the comparing step. In the illustrated method, the comparing step includes the step of summing the weighted factors for each independent result.

REFERENCES:
patent: 3832900 (1974-09-01), Ross
patent: 3922914 (1975-12-01), Fuchs
patent: 3995212 (1976-11-01), Ross
patent: 4135397 (1979-01-01), Krake
patent: 4322832 (1982-03-01), Sartorius
patent: 4713538 (1987-12-01), Theocharous
patent: 5122800 (1992-06-01), Philipp
patent: 5323361 (1994-06-01), Elle et al.
patent: 5345471 (1994-09-01), McEwan
patent: 5361070 (1994-11-01), McEwan
patent: 5376888 (1994-12-01), Hook
patent: 5391839 (1995-02-01), Lang et al.
patent: 5420517 (1995-05-01), Skaling et al.
Steven Arcone, "Conductivity limitations in single-reflection time-domain reflectometry", J. Phys. E. Sci. Instrum. 19 (1986), pp. 1067-1069.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Processor apparatus and method for a process measurement signal does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Processor apparatus and method for a process measurement signal, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Processor apparatus and method for a process measurement signal will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1710178

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.