Apparatus and method for measuring programmed antifuse resistanc

Details Apparatus and method for measuring programmed antifuse resistanc Apparatus and method for measuring programmed antifuse resistanc

1993-09-08

1995-05-09

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324713, 257530, 327525, 326 38, G01R 3102, G11C 1716

Patent

active

054143640

ABSTRACT:
Apparatus for measuring the resistance of a programmed antifuse in an integrated circuit is integrated on the same integrated circuit as the antifuse and is controlled by a programming circuit disposed on an integrated circuit and comprises a first voltage sensing transistor having a first drain/source electrically connected to a first I/O pad, a gate electrically connected to the programming circuit, and a second drain/source electrically connected to a first electrode of the antifuse, and a second voltage sensing transistor having a first drain/source electrically connected to a second I/O pad, a gate electrically connected to the programming circuit, and a second drain/source electrically connected to a second electrode of the antifuse.

REFERENCES:
patent: 5130777 (1992-07-01), Galbraith et al.
patent: 5194759 (1993-03-01), El-Ayat et al.
patent: 5243226 (1993-09-01), Chan
patent: 5272388 (1993-12-01), Bakker
patent: 5293133 (1994-03-01), Birkner et al.
patent: 5294846 (1994-03-01), Paivinen
patent: 5302546 (1994-04-01), Gordon et al.
patent: 5304871 (1994-04-01), Dharmarajan et al.

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