Formation of a magnetic film on an atomic force microscope canti

Details Formation of a magnetic film on an atomic force microscope canti Formation of a magnetic film on an atomic force microscope canti

1995-11-07

1997-03-18

Williams, Hezron E.

Measuring and testing

Surface and cutting edge testing

Roughness

G01B 528

Patent

active

056124910

ABSTRACT:
A thin film of a magnetic material is applied to one or both surfaces of a force sensing cantilever for use in a scanning force microscope. The cantilevers are then placed between the poles of an electromagnet and a magnetizing field applied in the direction of the soft axis of the cantilevers. The field is chosen so as to be bigger than the saturation field for the magnetic film.

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