Method for producing an opening in a layered semiconductor struc

Fishing – trapping – and vermin destroying

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437 47, 437 52, 437228, H01L 27108

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052702367

ABSTRACT:
The method produces an opening in a layered semiconductor structure having a site intended for an opening. A place-saver is produced on the structure from a first material to be selectively etched to the structure under the first material and to a material adjacent the site. A layer of a second material to which the first material is selectively etchable, is produced over the entire surface of the structure having the place-saver. The opening is formed by at least partially removing the layer of the second material above the place-saver, and removing the place-saver by selective etching.

REFERENCES:
patent: 4569119 (1986-02-01), Terada et al.
patent: 4728621 (1988-03-01), Graf et al.
patent: 4740480 (1988-04-01), Ooka
patent: 4826781 (1989-05-01), Asahina et al.
patent: 4843024 (1989-06-01), Ito
patent: 4988403 (1991-01-01), Matuo
patent: 4992389 (1991-02-01), Ogura et al.
patent: 4992394 (1991-02-01), Kostelak et al.
K. H. Kusters et al: Journal de Physique, Coll. C4, Suppl. aun=9, Tome 49, C4-503-C4-506 (date unknown).

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