Measurement and control of zeolite synthesis

Chemistry of inorganic compounds – Silicon or compound thereof – Oxygen containing

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23293R, 23295R, 423DIG5, 423DIG6, 436 4, 502 77, C01B 3326

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active

048491942

ABSTRACT:
The crystallization of a crystalline silicate product from an crystallization mixture is monitored by measuring the specific electrical conductivity of the mixture. The crystallization of metallosilicates, such as aluminosilicate zeolites, may be monitored in this way. Measurement of the electrical conductivity of the crystallization mixture may be carried out on line in a batch or continuous crystallization process. In a continuous process the conductivity may be monitored and used to control the crystallization process parameters in order to achieve a desired degree of crystallinity in the product.

REFERENCES:
patent: 3923697 (1975-12-01), Ellis
patent: 3999040 (1976-12-01), Ellis
patent: 4025307 (1977-05-01), Randolph et al.
patent: 4038050 (1977-07-01), Lowther
patent: 4046509 (1977-09-01), Backerud
patent: 4053864 (1977-10-01), Rodriguez
patent: 4056364 (1977-11-01), Dmistrovsky et al.
patent: 4064074 (1977-12-01), Ellis
patent: 4263010 (1981-04-01), Randolph
patent: 4277441 (1981-07-01), Sachs
patent: 4557858 (1985-12-01), Galloway

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