Method of fabricating a semiconductor structure having MOS and b

Fishing – trapping – and vermin destroying

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

437 33, 437 57, 437 41, 148DIG9, H01L 21265

Patent

active

051340828

ABSTRACT:
A method of fabricating a semiconductor structure having MOS and bipolar devices includes providing an isolation structure having MOS and bipolar active areas including doped wells. A collector region is formed in the bipolar active area well and a first semiconductor layer is then formed over the MOS and bipolar active areas. An active base region is formed in the bipolar active area well and a dielectric layer is formed on the first semiconductor layer over a portion of the bipolar active area. A window is formed through the dielectric layer and extends to the first semiconductor layer. A second semiconductor layer is then formed over the MOS and bipolar active areas. A gate electrode is formed on the MOS active area and emitter and collector electrodes are formed on the bipolar active area. The gate, emitter and collector electrodes are formed from both the first and second semiconductor layers and the emitter electrode extends into the window. After doping the emitter and collector electrodes, self-aligned source and drain regions are diffused into the MOS active area and an emitter region is diffused into the bipolar active area from the emitter electrode through the window.

REFERENCES:
patent: 4707456 (1987-11-01), Thomas et al.
patent: 4803175 (1989-02-01), Alvarez et al.
patent: 4808548 (1989-02-01), Thomas et al.
patent: 4830973 (1989-05-01), Mastroianni
patent: 4837176 (1989-06-01), Zdebel et al.
patent: 4902639 (1990-02-01), Ford
patent: 4960726 (1990-10-01), Lechaton et al.
patent: 4987089 (1991-01-01), Roberts
patent: 5008210 (1991-04-01), Chiang et al.
patent: 5034338 (1991-07-01), Neppl et al.
patent: 5037768 (1991-08-01), Cosentino
patent: 5079177 (1992-01-01), Lage et al.
patent: 5096843 (1992-03-01), Kodaira
Huang et al. "A High-Speed Bipolar Technology Featuring Self-Aligned Single-Poly Base and Submicrometer Emitter Contacts" IEEE Electron Device Letters vol. 11, #9 Sep. 79, pp. 402-404.
Ikeda et al., "Advanced BiCMOS Technology for High Speed VLSI", IEDM 86, pp. 408-411.
El-Diwany et al. "An Advanced BiCMOS Process Utilizing Ultra-Thin Silicon Epitaxy Over Arsenic Layers", IEDM 89 pp. 245-248.
de Jong et al. "Single Polysilicon Layer Advanced Super High-Speed BiCMOS Technology" IEEE 1989 pp. 182-185.
Kobayashi et al. "High Performance LSI Process Technology: SST CBiCMOS" IEDM 98 pp. 760-763.
Yuzuriha et al. "Submicron Bipolar-CMOS Technology Using 16 Ghz for Double Poly-SI Bipolar Devices", IEDM 88 pp. 748-751.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of fabricating a semiconductor structure having MOS and b does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of fabricating a semiconductor structure having MOS and b, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of fabricating a semiconductor structure having MOS and b will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1686794

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.