Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1998-12-21
2000-02-08
Evans, F. L.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
G01J 318
Patent
active
060233303
ABSTRACT:
A detection system for an atomic emission spectrometer includes a spherical convex diffraction grating having a radius of curvature which is one-half the radius of curvature of a pair of concave spherical mirrors. The diffraction grating and mirrors are positioned within a chamber such that their centers of curvature coincide at the focal plane to which a plurality of relatively small spaced-apart linear detectors are positioned on opposite sides of an emission entry slit to provide detection of alternate segments of a spectral band of wavelengths of interest.
REFERENCES:
patent: 5768040 (1998-06-01), Macenka et al.
patent: 5880834 (1999-03-01), Chrisp
NASA Tech Briefs, Mar. 1998, Convex-Grating Spectrometer With Two Spherical Mirrors.
Optical Engineering, Apr. 1987, "Annular Field systems and the Future of Optical Icrolithography".
Applied Optics, Dec. 1977, "Concentric Spectrographs".
Applied Optics, Nov. 1998, "Convex Grating Types for Concentric Imaging Spectrometers".
Marshall Kim Alvin
Willis Peter Markel
Evans F. L.
Leco Corporation
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