Semiconductor testing device with redundant circuits

Details Semiconductor testing device with redundant circuits Semiconductor testing device with redundant circuits

1997-07-25

1999-11-30

Ballato, Josie

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

348126, G01R 3128

Patent

active

059949147

ABSTRACT:
In a semiconductor testing device, the defective data of a semiconductor device which is detected by a defective detection unit 1 are converted to address data on the basis of inherent information such as the cell size, the divisional size, etc. of the semiconductor device by an address conversion unit 2, and the address data are compared with a redundant circuit area of the semiconductor device to make a quality (defective or non-defective) judgment of the semiconductor device by a judgment unit 3, whereby when any defective exists in the semiconductor device, the judgment as to whether the defective is replaceable (relievable) by the redundant circuits can be more accurately performed.

REFERENCES:
patent: 4736159 (1988-04-01), Shiragasawa et al.
patent: 4761607 (1988-08-01), Shiragasawa et al.
patent: 4965515 (1990-10-01), Karasawa
patent: 5436559 (1995-07-01), Takagi et al.

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