Method of fabricating a semiconductor device

Fishing – trapping – and vermin destroying

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

437231, 156643, 156662, H01L 21465, H01L 21471

Patent

active

048106690

ABSTRACT:
In a method of fabricating a semiconductor device, a trench is formed on a semiconductor substrate on which a circuit element or electrode conductor is formed, and is filled with polysilicon, a planarizing material is applied with polyvinyl alcohol (PVA) aqueous solution onto the polysilicon to form a PVA film, and the entire surface of the semiconductor substrate is dry-etched with etching conditions that makes the ratio of the etching rate of the PVA film and the polysilicon film to be within the range of 1:1 to 1:2.

REFERENCES:
patent: 4038110 (1977-07-01), Feng
patent: 4046595 (1977-09-01), Ohkubo et al.
patent: 4359512 (1982-11-01), Fukuda et al.
patent: 4627988 (1986-12-01), Spanjer
patent: 4741926 (1988-05-01), White et al.
patent: 4764483 (1988-08-01), Fuse et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of fabricating a semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of fabricating a semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of fabricating a semiconductor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1668672

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.